RF Plasma Thin Film Deposition: Silicon Oxide and Yttrium Containing Films

Date

2004

Journal Title

Journal ISSN

Volume Title

Publisher

Alfred University. Faculty of Ceramic Engineering. Kazuo Inamori School of Engineering

Abstract

The atmospheric RF plasma thin film deposition system was reassembled and used to deposit SiO_{2} coatings. These coatings were deposited on microscope glass slide substrates as well as the exterior of cylindrical glass tubes. An aluminum rod was also used as a substrate. The atmospheric system was modified to work as a vacuum system so thin film coatings could be deposited on the interior of glass tubes. A water cooled coil was obtained to provide the energy necessary to form plasma. The existing aerosol mist delivery system was modified to work in a vacuum. Silicon dioxide and yttrium containing films were deposited in a vacuum. Coatings were analyzed with SEM and EDS analysis at Alfred University. Coatings were also analyzed with ESCA, SNMS, FTIR-ATR, SEM, and EDS at the labs of Osram Sylvania.

Description

Keywords

Vttria, rf plasma deposition, Thin films, Silica, Vacuum

Citation

DOI