The Use of Microstructure Simulation and a Pattern Matching Library Method for EBSD Grain Size Measurement Analysis
Date
2016-05
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
New York State College of Ceramics at Alfred University. Kazuo Inamori School of Engineering.
Abstract
Grain size data from electron backscatter diffraction (EBSD) maps is often
reported as the circle equivalent diameter of the measured grain area. Circle equivalent
diameters are not directly comparable to the lineal intercept measurements historically
employed for grain size measurements obtained via optical microscopy. While the value
of mean lineal intercept is the same in 2D and 3D, the 2D circle equivalent section
diameter is not directly related to any 3D property. Estimation of mean lineal intercept
from circle equivalent diameter is usually carried out by assuming feature circularity,
despite the obvious corners that are inherent to grains from the requirements of space
filling. A direct conversion between section areas and lineal intercepts can be performed
if the grain perimeters are known. In the present work, a novel pattern-matching library
approach is investigated for measurement of grain perimeters on simulated 2D EBSD
maps. The results are compared to alternative approaches for perimeter measurement and
assessed with respect to spatial resolution, grain size distribution parameters, and relevant
ASTM and ISO measurement standards. The benefits and drawbacks of each approach
are discussed.
Description
Advisory committee members: S.K. Sundaram, Steven Tidrow. Dissertation completed in partial fulfillment of the requirements for the degree of Masters of Science in Materials Science and Engineering at the Kazuo Inamori School of Engineering, New York State College of Ceramics at Alfred University
Type
Thesis