The Use of Microstructure Simulation and a Pattern Matching Library Method for EBSD Grain Size Measurement Analysis

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New York State College of Ceramics at Alfred University. Kazuo Inamori School of Engineering.
Grain size data from electron backscatter diffraction (EBSD) maps is often reported as the circle equivalent diameter of the measured grain area. Circle equivalent diameters are not directly comparable to the lineal intercept measurements historically employed for grain size measurements obtained via optical microscopy. While the value of mean lineal intercept is the same in 2D and 3D, the 2D circle equivalent section diameter is not directly related to any 3D property. Estimation of mean lineal intercept from circle equivalent diameter is usually carried out by assuming feature circularity, despite the obvious corners that are inherent to grains from the requirements of space filling. A direct conversion between section areas and lineal intercepts can be performed if the grain perimeters are known. In the present work, a novel pattern-matching library approach is investigated for measurement of grain perimeters on simulated 2D EBSD maps. The results are compared to alternative approaches for perimeter measurement and assessed with respect to spatial resolution, grain size distribution parameters, and relevant ASTM and ISO measurement standards. The benefits and drawbacks of each approach are discussed.
Advisory committee members: S.K. Sundaram, Steven Tidrow. Dissertation completed in partial fulfillment of the requirements for the degree of Masters of Science in Materials Science and Engineering at the Kazuo Inamori School of Engineering, New York State College of Ceramics at Alfred University